Focused Ion Beam Market Long-Term Industry Outlook to 2032
FIB technology has changed dramatically in the last ten years, progressing from single-beam ion source Ga⁺ to multi-beam systems that include either scanning electron microscopes (SEMs) or plasma ion sources, in addition to improved patterning capabilities. Such advancements have led to precise failure analysis, circuit edits, and 3D tomography of semiconductors, electronics, and biomaterials.