Focused Ion Beam Market – Global Market Size, Strategic Growth Drivers
Focused Ion Beam (FIB) systems are sophisticated instruments utilized primarily in semiconductor fabrication, materials science, and nanotechnology for imaging, site-specific analysis, and modification at the micro- and nanoscale. FIB technology has changed dramatically in the last ten years, progressing from single-beam ion source Ga⁺ to multi-beam systems that include either scanning electron microscopes (SEMs) or plasma ion sources, in addition to improved patterning capabilities.